An active pixel sensor (APS) is an image sensor consisting of an integrated circuit containing an array of pixels, each containing a photodetector as well as three or more transistors. Since it can be produced by an ordinary CMOS process, APS is emerging as an inexpensive alternative to CCDs.
In 1992, Dr. Eric Fossum, et al, published the first extensive article (1) predicting the emergence of APS sensors as the commercial successor of CCDs. Between 1993 and 1995, the Jet Propulsion Laboratory developed a number of prototype devices which validated the key features of the technology. Though primitive, these devices demonstrated good image performance with high readout speed and low power consumption.
In 1995, personnel from JPL founded Photobit Corp., who continued to perfect and commercialize APS technology for a number of applications, such as web cams, digital radiography, endoscopy and cell phone cameras.
The APS pixel solves the noise, speed, and scalability issues of the passive pixel sensor. APS sensors have several important advantages over CCDs. They consume far less power, have less image lag, and can be fabricated on much cheaper and more available manufacturing lines. Unlike CCDs, APS sensors can combine both the image sensor function and image processing functions within the same integrated circuit. APS imagers still suffer from higher fixed pattern noise than CCDs, but active pixel sensors are catching up with respect to noise, dynamic range, and responsivity.
Because of these inherent advantages, APS sensors have become the technology of choice for many consumer applications, most significantly, the burgeoning cell phone camera market. However, adoption of APS image sensors has also found inroads in many other growing fields of photography and imaging. These include digital radiography, military ultra high speed image acquisition, high resolution 'smart' security cameras, as well as many other consumer applications.
A number of semiconductor manufacturers offer APS sensors of various types. These include Micron Technology, Inc. (who purchased Photobit Corp. in 2001), Toshiba, Inc., Omnivision Technology, Inc., Canon, among others.
(1) Proc. SPIE Vol. 1900, p. 2-14, Charge-Coupled Devices and Solid State Optical Sensors III, Morley M. Blouke; Ed.
The photodetector is usually a photodiode, though photogate detectors are used in some devices and can offer lower noise through the use of correlated double sampling. Light causes an accumulation, or integration of charge on the
One transistor, Mrst, acts as a switch to reset the device. When this transistor is turned on, the photodiode is effectively connected to the power supply, VRST, clearing all integrated charge. Since the reset transistor is n-type, the pixel operates in soft reset.
The second transistor, Msf, acts as a buffer (specifically, a source follower), an amplifier which allows the pixel voltage to be observed without removing the accumulated charge. Its power supply, VDD, is typically tied to the power supply of the reset transistor.
The third transistor, Msel, is the row-select transistor. It is a switch that allows a single row of the pixel array to be read by the read-out electronics.
Another way to achieve hard reset is to lower the voltage of VRST without lowering the on-voltage of RSTG. This causes reduced headroom, but does not affect fill factor, unless VDD is kept as a separate wire with its original voltage.
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